An experimental investigation of resonance curves on metallic surfaces in dynamic force microscopy: The influence of frozen versus mobile charges

Nanotechnology

Volumn 15, Issue 2, 2004, Pages

  Polesel Maris, Jérôme ^a   Piednoir, Agnès ^a,b   Zambelli, Tomaso ^a   Bouju, Xavier ^a   Gauthier, Sébastien ^a  

^a CEMES CNRS   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; CHARGE LEAKAGE; DYNAMIC FORCE MICROSCOPY; ELECTRON FIELD EMISSION;

ALUMINA; COPPER; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTROSTATICS; MICROSCOPIC EXAMINATION; OXIDATION; RESONANCE; SEMICONDUCTOR DOPING; SILICON; SUBSTRATES; VAN DER WAALS FORCES;

METALS;

EID: 1442337048     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/2/006     Document Type: Article

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