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Volumn 15, Issue 2, 2005, Pages 394-399

Localized induction heating solder bonding for wafer level MEMS packaging

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; ELECTRIC POTENTIAL; ELECTRONICS PACKAGING; ELECTROPLATING; INDUCTION HEATING; MAGNETIC THIN FILMS; MICROMACHINING; SILICON WAFERS; SOLDERING; THIN FILMS;

EID: 14244250419     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/2/020     Document Type: Article
Times cited : (104)

References (12)
  • 9
    • 0032083807 scopus 로고    scopus 로고
    • Reliability of industrial packaging for microsystems
    • Reus R D et al 1998 Reliability of industrial packaging for microsystems Microelectron. Reliab. 38 1251-60
    • (1998) Microelectron. Reliab. , vol.38 , pp. 1251-1260
    • Reus, R.D.1
  • 12
    • 4243069265 scopus 로고
    • Colombus, OH: The American Society for Nondestructive Testing, Inc.
    • Hagemaier D J 1990 Fundamentals of Eddy Current Testing (Colombus, OH: The American Society for Nondestructive Testing, Inc.)
    • (1990) Fundamentals of Eddy Current Testing
    • Hagemaier, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.