Lateral photovoltage measurements in hydrogenated amorphous silicon and silicon-oxygen thin films

Journal of Non-Crystalline Solids

Volumn 351, Issue 5, 2005, Pages 426-431

  Kodolbas A O ^a   Comak B ^a   Bacioglu A ^a   Oktu O ^a  

^a HACETTEPE UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DIFFUSION; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRODES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLOW DISCHARGES; HYDROGENATION; PHOTOCONDUCTIVITY; PHOTOVOLTAIC EFFECTS; SEMICONDUCTOR LASERS; SILICON ALLOYS; THERMAL EFFECTS;

DIFFUSION ELECTRON; PHOTOCARRIERS; PHOTOVOLTAIC MEASUREMENTS; SILICON-OXYGEN THIN FILMS;

THIN FILMS;

EID: 14044280053     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.01.005     Document Type: Article

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