Non-gaussian transport measurements and the einstein relation in amorphous silicon

Physical Review Letters

Volumn 76, Issue 17, 1996, Pages 3196-3199

  Gu, Qing ^a   Schiff, E A ^a   Grebner, S ^b   Wang, F ^b   Schwarz, R ^b  

^a SYRACUSE UNIVERSITY   (United States)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243997565     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.3196     Document Type: Article

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