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Volumn 12, Issue 7, 2001, Pages 387-393
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A comparative study of position-sensitive detectors based on Schottky barrier crystalline and amorphous silicon structures
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
CRYSTALLINE MATERIALS;
DETECTORS;
FABRICATION;
LASER PULSES;
OPTICAL SENSORS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SCHOTTKY BARRIER DIODES;
SCHOTTKY BARRIER CRYSTALLINE STRUCTURES;
THIN FILM DEVICES;
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EID: 0035389503
PISSN: 09574522
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1011230630886 Document Type: Article |
Times cited : (44)
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References (10)
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