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Volumn 227-230, Issue PART 2, 1998, Pages 1311-1315
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A two-dimensional visible/infrared detector based on μc-Si:H p-i-n structures
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Author keywords
Contour sensor; Electrical network; Lateral photoeffect; Microcrystalline silicon; Photosensor
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Indexed keywords
COMPUTER SIMULATION;
CRYSTALLINE MATERIALS;
INFRARED DETECTORS;
OHMIC CONTACTS;
SEMICONDUCTOR JUNCTIONS;
CONTOUR SENSORS;
LATERAL PHOTOEFFECTS;
MICROCRYSTALLINE SILICONS;
TWO-DIMENSIONAL VISIBLE/INFRARED DETECTORS;
SEMICONDUCTING SILICON;
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EID: 0032065202
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(98)00354-8 Document Type: Article |
Times cited : (11)
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References (12)
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