Resonant Raman scattering and atomic force microscopy of InGaAs/GaAs multilayer nanostructures with quantum dots

Semiconductors

Volumn 39, Issue 1, 2005, Pages 127-131

  Valakh, M Ya ^a   Strelchuk, V V ^a   Kolomys, A F ^a   Mazur, Yu I ^b   Wang, Z M ^b   Xiao, M ^b   Salamo, G J ^b  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 13944271949     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1852661     Document Type: Article

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