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Volumn 59, Issue 1-3, 1999, Pages 202-206
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X-ray analysis of the texture of heteroepitaxial gallium nitride films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
METALLOGRAPHIC PHASES;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MOLECULAR BEAM EPITAXY;
NUCLEATION;
SAPPHIRE;
SEMICONDUCTING GALLIUM COMPOUNDS;
STACKING FAULTS;
SUBSTRATES;
TEXTURES;
X RAY DIFFRACTION ANALYSIS;
HETEROEPITAXIAL GALLIUM NITRIDE FILMS;
POLYCRYSTALLINE GROWTH;
SPHALERITE;
WURTZITE;
X RAY TEXTURE DIFFRACTOMETRY;
THIN FILMS;
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EID: 0033528937
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(98)00391-2 Document Type: Article |
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Times cited : (16)
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References (9)
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