Polarization-dependent Raman spectra of thin crystalline silicon films

Journal of Applied Physics

Volumn 97, Issue 3, 2005, Pages

  Lu, Z Q ^a   Quinn, T ^a   Reehal, H S ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY WAFERS; MICROCRYSTALLINE FILMS; QUASIEPITAXIAL FILMS; THIN CRYSTALLINE SILICON FILMS;

CHARGE COUPLED DEVICES; CRYSTALLINE MATERIALS; CYCLOTRON RESONANCE; ELECTRON RESONANCE; HEAT TREATMENT; MATHEMATICAL MODELS; MICROWAVES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLARIZATION; RAMAN SCATTERING; SEMICONDUCTING SILICON; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 13744252852     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1844613     Document Type: Article

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