-
1
-
-
0024641687
-
Stress-related effects in thin films
-
J.A. Thornton, and D.W. Huffman, "Stress-related effects in thin films," Thin Solid Films 171, pp. 5-31, 1989.
-
(1989)
Thin Solid Films
, vol.171
, pp. 5-31
-
-
Thornton, J.A.1
Huffman, D.W.2
-
2
-
-
0017002636
-
Michelson interferometer for deformation measurements in an UHV system at elevated temperatures
-
K. Roll, and H. Hoffmann, "Michelson interferometer for deformation measurements in an UHV system at elevated temperatures," Rev. Sci. Instrum. 47, pp. 1183-1185, 1976.
-
(1976)
Rev. Sci. Instrum.
, vol.47
, pp. 1183-1185
-
-
Roll, K.1
Hoffmann, H.2
-
3
-
-
0001314608
-
Stress anisotropy in evaporated iron films
-
J. D. Finegan, and R. W. Huffman, "Stress Anisotropy in Evaporated Iron Films," J. Appl. Phys. 30 pp. 597-598, 1959.
-
(1959)
J. Appl. Phys.
, vol.30
, pp. 597-598
-
-
Finegan, J.D.1
Huffman, R.W.2
-
4
-
-
84957480600
-
Stress developed in optical film coatings
-
A. E. Ennos, "Stress developed in optical film coatings," Appl. Optics 5, pp. 51-61, 1966.
-
(1966)
Appl. Optics
, vol.5
, pp. 51-61
-
-
Ennos, A.E.1
-
5
-
-
0034655048
-
The measurement of thin film stress using phase shifting interferometry
-
C. L. Tien, C. C. Lee, and C. C. Jaing, "The measurement of thin film stress using phase shifting interferometry," J. Mod. Opt. 47, pp. 839-849, 2000.
-
(2000)
J. Mod. Opt.
, vol.47
, pp. 839-849
-
-
Tien, C.L.1
Lee, C.C.2
Jaing, C.C.3
-
7
-
-
0011739775
-
An improved optical lever technique for measuring film stress
-
T. Aoki, Y. Nishikawa, and S. Kato, "An improved optical lever technique for measuring film stress," Jpn. J. Appl. Phys. 28, pp. 299-300, 1989.
-
(1989)
Jpn. J. Appl. Phys.
, vol.28
, pp. 299-300
-
-
Aoki, T.1
Nishikawa, Y.2
Kato, S.3
-
8
-
-
0000519955
-
Mechanical-stress as a function of temperature for aluminum-alloy films
-
D. S. Gardner, and P. A. Flinn, "Mechanical-stress as a function of temperature for aluminum-alloy films," J. Appl. Phys. 67, pp. 1831-1844, 1990.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 1831-1844
-
-
Gardner, D.S.1
Flinn, P.A.2
-
9
-
-
0001221536
-
Thin film stress from nonspherical substrate bending measurements
-
D. E. Fahnline, C. B. Masters, and N. J. Salamon, "Thin film stress from nonspherical substrate bending measurements," J. Vac. Sci. Technol. A9, pp. 2483-2487, 1991.
-
(1991)
J. Vac. Sci. Technol.
, vol.A9
, pp. 2483-2487
-
-
Fahnline, D.E.1
Masters, C.B.2
Salamon, N.J.3
-
10
-
-
0020182914
-
Strain-induced anisotropy measurement in oxide films grown on silicon
-
M. E. Pedinoff, D. C. Mayer, O. M. Stafsudd, and G. L. Dunn, "Strain-induced anisotropy measurement in oxide films grown on silicon," Appl. Optics 21, pp. 3307-3313, 1982.
-
(1982)
Appl. Optics
, vol.21
, pp. 3307-3313
-
-
Pedinoff, M.E.1
Mayer, D.C.2
Stafsudd, O.M.3
Dunn, G.L.4
-
11
-
-
0036542846
-
5 thin films deposited by ion-beam sputtering
-
5 thin films deposited by ion-beam sputtering," Appl. Optics 41, pp. 2043-2047, 2002.
-
(2002)
Appl. Optics
, vol.41
, pp. 2043-2047
-
-
Lee, C.C.1
Tien, C.L.2
Hsu, J.C.3
-
12
-
-
0040750440
-
An apparatus for the measurement of internal stress and thermal expansion coefficient of metal oxide films
-
C. C. Lee, C. L. Tien, W. S. Sheu, and C. C. Jaing, "An apparatus for the measurement of internal stress and thermal expansion coefficient of metal oxide films," Rev. Sci. Instrum. 72, pp. 2128-2133, 2001.
-
(2001)
Rev. Sci. Instrum.
, vol.72
, pp. 2128-2133
-
-
Lee, C.C.1
Tien, C.L.2
Sheu, W.S.3
Jaing, C.C.4
-
13
-
-
0000307577
-
Improvement of mechanical properties of a-C:H by silicon addition
-
C. De Martino, G. Fusco, G. Mina, A. Tagliaferro, L. Vanzetti, L. Calliari, M. Anderle, "Improvement of mechanical properties of a-C:H by silicon addition," Diamond Relat. Mater. 6, pp. 559-563, 1997.
-
(1997)
Diamond Relat. Mater.
, vol.6
, pp. 559-563
-
-
De Martino, C.1
Fusco, G.2
Mina, G.3
Tagliaferro, A.4
Vanzetti, L.5
Calliari, L.6
Anderle, M.7
-
14
-
-
0032476310
-
Structural modifications and temperature stability of silicon incorporated diamond-like a-C:H films
-
S.S. Camargo Jr., R. A. Santos, A.L. Baia Neto, R. Carius, and F. Finger, "Structural modifications and temperature stability of silicon incorporated diamond-like a-C:H films," Thin Solid Films 332, pp. 130-135, 1998.
-
(1998)
Thin Solid Films
, vol.332
, pp. 130-135
-
-
Camargo Jr., S.S.1
Santos, R.A.2
Neto, A.L.B.3
Carius, R.4
Finger, F.5
-
15
-
-
0036530752
-
Improvement of the efficiency of the silicon solar cells by silicon incorporated diamond-like carbon antireflective coatings
-
V. Buršíková, P. Sládek, P. St'ahel, L. Zajíčková, "Improvement of the efficiency of the silicon solar cells by silicon incorporated diamond-like carbon antireflective coatings," J. Non-Cryst. Solids 299, pp. 1147-1151, 2002.
-
(2002)
J. Non-cryst. Solids
, vol.299
, pp. 1147-1151
-
-
Buršíková, V.1
Sládek, P.2
St'ahel, P.3
Zajíčková, L.4
-
16
-
-
0037083751
-
Temperature dependence of mechanical properties of DLC/Si thin protective coatings prepared by PECVD
-
V. Buršíková, V. Navrátil, L. Zajíčková, J. Janča, "Temperature Dependence of Mechanical Properties of DLC/Si Thin Protective Coatings Prepared by PECVD," Mater. Sci. Eng. A324, pp. 251-254, 2002.
-
(2002)
Mater. Sci. Eng.
, vol.A324
, pp. 251-254
-
-
Buršíková, V.1
Navrátil, V.2
Zajíč ková, L.3
Janča, J.4
-
18
-
-
0242381992
-
New dispersion model of the optical constants of the DLC films
-
D. Franta, L. Zajíčková, V. Burší ková, I. Ohlídal, "New Dispersion Model of the Optical Constants of the DLC Films," Acta Phys. Slov. 53, pp. 373-384, 2003.
-
(2003)
Acta Phys. Slov.
, vol.53
, pp. 373-384
-
-
Franta, D.1
Zajíčková, L.2
Burší ková, V.3
Ohlídal, I.4
-
19
-
-
17144455106
-
x studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry
-
x studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry," Thin Solid Films 455-456, pp. 393-398, 2004.
-
(2004)
Thin Solid Films
, vol.455-456
, pp. 393-398
-
-
Franta, D.1
Ohlídal, I.2
Buršíková, V.3
Zajíčková, L.4
-
20
-
-
0000073841
-
The tension of metallic films deposited by electrolysis
-
G. G. Stoney, "The tension of metallic films deposited by electrolysis," Proc. R. Soc. London Ser. A82, pp. 172-175, 1909.
-
(1909)
Proc. R. Soc. London Ser.
, vol.A82
, pp. 172-175
-
-
Stoney, G.G.1
-
21
-
-
0000096595
-
Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
-
C.M. Herzinger, B. Johs, W. A. McGahan, J.A. Woollam, W. Paulson, "Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation," J. Appl. Phys. 83, pp. 3323-3336, 1998.
-
(1998)
J. Appl. Phys.
, vol.83
, pp. 3323-3336
-
-
Herzinger, C.M.1
Johs, B.2
McGahan, W.A.3
Woollam, J.A.4
Paulson, W.5
-
22
-
-
0030565779
-
Laser diagnostics of mechanical and elastic properties of silicon and carbon films
-
P. Hess, "Laser diagnostics of mechanical and elastic properties of silicon and carbon films," Appl. Surf. Sci. 106, pp. 429-437, 1996.
-
(1996)
Appl. Surf. Sci.
, vol.106
, pp. 429-437
-
-
Hess, P.1
-
23
-
-
0030386908
-
Elastic modulus determination from depth sensing indentation testing
-
J. Gubicza, A. Juhász, P. Arato, P. Szommer, P. Tasnádi, G. Voros, "Elastic modulus determination from depth sensing indentation testing," J. Mat. Sci. Lett. 15, pp. 2141-2144, 1996.
-
(1996)
J. Mat. Sci. Lett.
, vol.15
, pp. 2141-2144
-
-
Gubicza, J.1
Juhász, A.2
Arato, P.3
Szommer, P.4
Tasnádi, P.5
Voros, G.6
|