Simulation and measurement of supply and substrate noise in mixed-signal ICs

IEEE Journal of Solid-State Circuits

Volumn 40, Issue 2, 2005, Pages 382-390

  Owens, Brian E ^a   Adluri, Sirisha ^a   Birrer, Patrick ^a   Shreeve, Robert ^a   Arunachalam, Sasi Kumar ^a   Mayaram, Kartikeya ^a   Fiez, Terri S ^a  

^a Oregon State University   (United States)

Author keywords

Coupling noise; Integrated circuit noise; Mixed signal noise; Substrate coupling; Substrate noise; Supply noise

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COUPLED CIRCUITS; ELECTRONICS PACKAGING; INDUCTANCE MEASUREMENT; NOISE ABATEMENT; SIGNAL DETECTION; SPURIOUS SIGNAL NOISE; SUBSTRATES; VOLTAGE CONTROL;

COUPLING NOISE; INTEGRATED CIRCUIT (IC) NOISE; MIXED SIGNAL NOISE; SUBSTRATE COUPLING; SUBSTRATE NOISE; SUPPLY NOISE;

INTEGRATED CIRCUITS;

EID: 13444293227     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.841039     Document Type: Article

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