Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

IEEE Journal of Solid-State Circuits

Volumn 38, Issue 7, 2003, Pages 1250-1260

  Badaroglu, Mustafa ^a,b   Donnay, Stéphane ^a   De Man, Hugo J ^a,b   Zinzius, Yann A ^b   Gielen, Georges G E ^b   Sansen, Willy ^b   Fondén, Tony ^c   Signell, Svante ^c,d  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c ERICSSON RESEARCH   (Sweden)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Crosstalk; Integrated circuit modeling; Mixed analog digital ICs; Power distribution; Resonance analysis; Substrate noise; System on a chip

Indexed keywords

CMOS INTEGRATED CIRCUITS; CROSSTALK; RESONANCE; SPURIOUS SIGNAL NOISE;

NOISE GENERATION;

SIGNAL PROCESSING;

EID: 0037817784     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.813254     Document Type: Article

References (19)

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