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Physica B: Condensed Matter

Volumn 357, Issue 1-2 SPEC. ISS., 2005, Pages 6-10

Composition determination of semiconductor quantum wires by X-ray scattering

(8) Hsu, C H a Tang, Mau Tsu a Lee, Hsin Yi a Huang, Chih Mon a Liang, K S a Lin, S D b Lin, Z C b Lee, C P b

a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

b NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

Author keywords

Quantum wires; X ray scattering

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; PARAMETER ESTIMATION; SELF ASSEMBLY; STRUCTURE (COMPOSITION); X RAY SCATTERING;

BRAGG DIFFRACTION; OPTOELECTRONIC INDUSTRY; POTENTIAL APPLICATIONS; STRAIN FIELD;

SEMICONDUCTOR QUANTUM WIRES;

EID: 13444288094 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2004.11.008 Document Type: Conference Paper

Times cited : (4)

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