X-ray scattering studies on InGaAs quantum dots

Physica B: Condensed Matter

Volumn 336, Issue 1-2, 2003, Pages 98-102

  Hsu, C H ^a   Lee, H Y ^a   Hsieh, Y W ^a   Stetsko, Y P ^a   Tang, M T ^a   Liang, K S ^a   Yeh, N T ^b   Chyi, J I ^b   Noh, D Y ^c  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Quantum dots; X ray scattering

Indexed keywords

MOLECULAR BEAM EPITAXY; SEGREGATION (METALLOGRAPHY); SELF ASSEMBLY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; X RAY SCATTERING;

GRAZING INCIDENCE X RAY SCATTERING;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0037668969     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00276-X     Document Type: Conference Paper

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