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Volumn 84, Issue 3, 2004, Pages 335-337

Carrier lifetime in conductive and vanadium-doped 6H-SiC substrates

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE WAFERS; LIGHT-INDUCED TRANSIENT GRATING (LITG) TECHNIQUE; PHOTOEXCITATION; RADIATIVE RECOMBINATION;

EID: 1342283833     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1641172     Document Type: Article
Times cited : (36)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.