Reduce yield loss in delay defect detection in slack interval

Proceedings of the Asian Test Symposium

Volumn , Issue , 2004, Pages 372-377

  Yan, Haihua ^a   Singh, Adit D ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; DEFECTS; ERROR ANALYSIS; SIGNAL PROCESSING; STATISTICAL METHODS; SWITCHING; WSI CIRCUITS;

CIRCUIT UNDER TEST (CUT); DEEP SUB-MICRON TECHNOLOGY (DSM); DELAY DEFECT DETECTION IN SLACK INTERVAL (DDSI); DELAY FAULTS;

DIGITAL CIRCUITS;

EID: 13244264677     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Singh, A.D., Van, H., "Detecting Delay Defects in Slack Intervals using Multiple Higher Clock Frequencies and Results from Neighboring Die", Digest of Papers, European Test Workshop, 2003.
2. Van, H., Singh, A.D. "Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighboring Die", Proceedings of International Test Conference 2003
3. Nigh, P. "The Importance of On-line Testing to Enhance High-Reliability Performance", Proceedings of International Test Conference 2003
4. Adit D. Singh "Should Nanometer Circuits be Periodically Tested in the Field?". ITC2003
5. J.-J. Liou, K.-T. Cheng, and D. Mukherjee. "Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis". Proceedings of IEEE VLSI Test Symposium, April 2000.
6. J-J. Liou, L-C. Wang, K-T. Cheng, J. Dworak, M. R. Mercer, R. Kapur, and T.W. Williams. "Enhancing Test Efficiency for Delay Fault Testing Using Multiple-Clocked Schemes", in Proceedings of Design Automation Coneference, June 2002.
7. N. Tendolkar, " Analysis of Timing Failure Due to Random AC Defects in VLSI Modules", IEEE 22nd Design Automation Conference, 1985
8. H. Van, A.D. Singh, "Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study", ITC04
9. Li, J.C.M.; McCluskey, E.J.; "Testing for tunneling opens" ITC Proceedings 2000
10. H. Van, A.D. Singh, "Delay Fault Diagnosis Based on Delay Defect Detection within Slack Intervals", North Atlantic Test Workshop, 2004
11. J.Saxena, K. Butler, V. Jayaram, S. Kundu, N. Arvind, P. Sreeprakash, M. Hachinger, "A Case Study of IR-Drop in Structured At-Speed Testing", Proceedings ITC2003
12. B. Davis, The Economics of Automatic Testing. London, UK: McGraw-Hill, 1982