Should Nanometer Circuits be Periodically Tested in the Field?

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 1280-

  Singh, Adit D ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; FAILURE ANALYSIS; NANOTECHNOLOGY;

NANOMETER CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0142153651     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)