Noise behavior of SiGe n-MODFETS

Materials Science in Semiconductor Processing

Volumn 8, Issue 1-3 SPEC. ISS., 2005, Pages 383-388

  Rennane, A ^a,b   Bary, L ^a   Cibiel, G ^a   Llopis, O ^a   Hackbarth, T ^c   Graffeuil, J ^a,b   Plana, R ^a,b  

^a LAAS CNRS   (France)

^b UNIVERSITÉ PAUL SABATIER   (France)

^c DAIMLER AG   (Germany)

Author keywords

Carrier number fluctuations; Low frequency noise; Mobility fluctuations; n MODFETS; Residual phase noise measurement; SiGe

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; ION IMPLANTATION; LEAKAGE CURRENTS; NOISE GENERATORS; OSCILLATORS (ELECTRONIC); SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SPURIOUS SIGNAL NOISE;

CARRIER NUMBER FLUCTUATION; LOW FREQUENCY NOISE; MOBILITY FLUCTUATION; N-MODULATION DOPED FIELD EFFECT TRANSISTORS (MODFET); RESIDUAL PHASE NOISE MEASUREMENT; SIGE;

FIELD EFFECT TRANSISTORS;

EID: 13244257194     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2004.09.107     Document Type: Conference Paper

References (11)

1. 0.45 n-MODFET's IEEE Trans Electron Dev 47 2000 1477 1483
2. x FET's IEEE Trans Electron Dev 42 1995 1841 1846
3. M. Glük, T. Hackbarth, U. König, A. Haas, G. Hock, and E. Kohn High Fmax n-type Si/SiGe n-MODFET' Electron Lett 33 1997 335 337
4. U. König, M. Zeuner, G. Höck, T. Hackbarth, M. Glück, T. Ostermann, and M. Saxarra n-and p-type SiGe HFETs and circuits Solid State Electron 43 1999 1383 1388
5. L. Bary, M. Borgarino, R. Plana, T. Parra, S.J. Kovacic, H. Lafontaine, and J. Graffeuil Transimpedance Amplifier-Based Full Low-Frequency Noise Characterization Setup for Si/SiGe HBTs IEEE Trans Electron Dev 48 4 2001 767 773
6. J.A. Garrido, F. Calle, E. Munoz, I. Izpura, J.L. Sanchez-Rojas, R. LI, and K.L. Wang Low Frequency Noise and Screening effect in AlGaN/GaN HEMTs Electron Lett-IEE 34 24 1998 2357 2359
7. Shawn SH, Valizadeh P, Pavlidis D. Characterization and analysis of Gate and Drain LFN in AlGaN/GaN HEMTs. Report of HRL Laboratories. USA: 2001.
8. T.G.M. Kleinpenning Low frequency noise in schottky barrier diodes Solid-State Electronics 22 1979 121 128
9. S.T. Hsu Low frequency excess noise in metal-silicon schottky barrier diodes IEEE Trans on Electron Devices 17 1970 496 506
10. A. Pénarier, S.G. Jarrix, C. Delseny, F. Pascal, J.C. Vildeuil, M. Valenza, and D. Rigaud Low frequency noise in III-V high-speed devices IEE Proc Circuits Dev Syst 149 1 2002 59 67
11. G. Cibiel, M. Regis, E. Tournier, and O. Llopis AM Noise Impact on Low Level Phase Noise Measurements IEEE Trans Ultrason, Ferroelect, Frequency Control 49 6 2002 1 5