AM noise impact on low level phase noise measurements

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 49, Issue 6, 2002, Pages 784-788

  Cibiel, Gilles ^b   Régis, Myrianne ^c   Tournier, Éric ^b   Llopis, Oliver ^a,b  

^a IEEE

^b LAAS CNRS   (France)

^c SiGe Semiconductor   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE; MICROWAVES; NONLINEAR SYSTEMS; PHASE MODULATION;

MICROWAVE RESIDUAL PHASE NOISES;

SPURIOUS SIGNAL NOISE;

ARTICLE;

EID: 0036591389     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2002.1009336     Document Type: Article

References (10)

1. Phase noise measurements using cross-spectrum analysis
2. Design considerations in state-of-the-art signal processing and phase noise measurements systems
3. Applications of interferometric signal processing to phase-noise reduction in microwave oscillators
4. Correlation-based phase noise measurements
5. Residual phase noise and AM noise measurements and techniques
6. Characterization of flicker noise in GaAs MESFET for oscillator applications
7. Residual phase noise measurements of VHF, UHF and microwave components
8. Low level and reflection phase noise measurements on a FET
9. Phase noise performance of microwave analog frequency dividers; Application to the characterization of oscillators up to the millimeter wave range
10. Evaluation of two non-standard techniques for the phase noise characterization at microwave frequencies