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Journal of the Korean Physical Society

Volumn 46, Issue 1, 2005, Pages 346-349

Fabrication and electrical properties of Pt/(Bi,La) 4Ti 3O 12/HfO 2/Si structures

(3) Park, Byung Eun a Takahashi, Kazuhiro b Ishiwara, Hiroshi b

a University of Seoul (South Korea)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

(Bi,La) 4Ti 3O 12; HfO 2; MBD; MFIS; Retention; Sol gel

Indexed keywords

EID: 12944291331 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: None Document Type: Conference Paper

Times cited : (26)

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