Numerical investigation of self-heating effects of oxide-confined vertical-cavity surface-emitting lasers

IEEE Journal of Quantum Electronics

Volumn 41, Issue 1, 2005, Pages 15-25

  Liu, Yang ^a,b   Ng, Wei Choon ^a,c   Choquette, Kent D ^a   Hess, Karl ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Integrated Systems Inc   (United States)

Author keywords

Charge carrier processes; Distributed Bragg reflector lasers; Hot carriers; Laser reliability; Laser thermal factors; Semiconductor heterojunctions; Semiconductor lasers

Indexed keywords

COMPUTER SIMULATION; CONTINUOUS WAVE LASERS; HETEROJUNCTIONS; HOT CARRIERS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PHONONS; SEMICONDUCTOR QUANTUM WELLS;

CHARGE CARRIER PROCESSES; DISTRIBUTED BRAGG REFLECTOR LASERS; LASER RELIABILITY; LASER THERMAL FACTORS; SELF-HEATING EFFECTS; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 12844268652     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2004.839239     Document Type: Article

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