Approaching zero: Using fractured crystals in metrology for replica molding

Journal of the American Chemical Society

Volumn 127, Issue 3, 2005, Pages 854-855

  Xu, Qiaobing ^a   Mayers, Brian T ^a   Lahav, Michal ^a   Vezenov, Dmitri V ^a   Whitesides, George M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIMETICONE; NANOPARTICLE; NANOTUBE; POLYMER; SILICONE; SILICONE OXIDE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; COMPOSITE MATERIAL; CRYSTAL STRUCTURE; SEMICONDUCTOR;

CRYSTALLIZATION; DIMETHYLPOLYSILOXANES; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; POLYURETHANES; SILICON; SILICONES;

EID: 12444303256     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja043436d     Document Type: Article

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