Investigation of Single-Event Transients in Voltage-Controlled Oscillators

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 2081-2087

  Chen, Wenjian ^a   Pouget, Vincent ^b   Barnaby, Hugh J ^a   Cressler, John D ^c   Niu, Guofu ^d   Fouillat, Pascal ^b   Deval, Yann ^b   Lewis, Dean ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b UNIVERSITÉ BORDEAUX 1   (France)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^d AUBURN UNIVERSITY   (United States)

Author keywords

Radio frequency; SiGe hetero junction bipolar transistor; Single event transients (SETs); Spectrum analyzer; Voltage controlled oscillators

Indexed keywords

BANDWIDTH; CATHODE RAY OSCILLOSCOPES; COMPUTER SIMULATION; DIFFERENTIAL AMPLIFIERS; HETEROJUNCTION BIPOLAR TRANSISTORS; LASER BEAMS; METALLIZING; MICROELECTRONICS; NATURAL FREQUENCIES; SPECTRUM ANALYZERS; TRANSCEIVERS; TRANSIENTS;

RADIO FREQUENCY (RF); SIGE HETEROJUNCTION BIPOLAR TRANSISTORS (HBT); SINGLE-EVENT TRANSIENTS (SET); VOLTAGE-CONTROLLED OSCILLATORS (VOC);

OSCILLATORS (ELECTRONIC);

EID: 1242332786     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.820766     Document Type: Conference Paper

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