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Volumn 107, Issue 2, 2004, Pages 224-232

Preliminary studies of properties of oxide thin/thick films for gamma radiation dosimetry

Author keywords

Electrical and optical properties; Gamma radiation; Metal oxides; Thin and thick films

Indexed keywords

COST EFFECTIVENESS; DEGRADATION; GAMMA RAYS; NUCLEAR FUELS; OPTICAL PROPERTIES; QUARTZ; RADIATION DETECTORS; STERILIZATION (CLEANING); SURFACE PROPERTIES; THERMOLUMINESCENCE; THICK FILMS; THIN FILMS;

EID: 1242322521     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.11.014     Document Type: Article
Times cited : (36)

References (28)
  • 7
    • 0003618545 scopus 로고    scopus 로고
    • R.F. Taylor, J.S. Schultz (Eds.), Institute of Physics Publishing, Bristol and Philadelphia
    • B. Hoffheins, in: R.F. Taylor, J.S. Schultz (Eds.), Handbook of Chemical and Biological Sensors, Institute of Physics Publishing, Bristol and Philadelphia, 1996, pp. 371-397.
    • (1996) Handbook of Chemical and Biological Sensors , pp. 371-397
    • Hoffheins, B.1
  • 12
    • 0005908470 scopus 로고
    • S.M. Sze (Ed.), John Wiley & Sons, Inc., New York, Chichester, Brisbane, Toronto, Singapore
    • S. Audet, J. Steigerwald, in: S.M. Sze (Ed.), Radiation Sensors, Semiconductor Sensors, John Wiley & Sons, Inc., New York, Chichester, Brisbane, Toronto, Singapore, 1994, pp. 271-329.
    • (1994) Radiation Sensors, Semiconductor Sensors , pp. 271-329
    • Audet, S.1    Steigerwald, J.2
  • 26
    • 1242315622 scopus 로고    scopus 로고
    • Thick film pn-junctions based on mixed oxides of indium and silicon as gamma radiation sensors
    • K. Arshak, O. Korostynska, J. Henry, Thick film pn-junctions based on mixed oxides of indium and silicon as gamma radiation sensors, Microelectronics International 1 (2004).
    • (2004) Microelectronics International , vol.1
    • Arshak, K.1    Korostynska, O.2    Henry, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.