Gamma Radiation Dosimetry Using Tellurium Dioxide Thin Film Structures

Proceedings of IEEE Sensors

Volumn 1, Issue 1, 2002, Pages 547-551

  Arshak, Khalil ^a   Korostynska, Olga ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

Dosimetry; Gamma radiation; Optical band gap; Tellurium dioxide; Thin films

Indexed keywords

ABSORPTION SPECTROSCOPY; DOSIMETRY; ELECTRIC PROPERTIES; GAMMA RAYS; OPTICAL PROPERTIES; PHOTONS; SEMICONDUCTOR MATERIALS; THIN FILMS; VAPOR DEPOSITION; X RAYS;

OPTICAL BAND GAP; TELLURIUM DIOXIDE;

TELLURIUM COMPOUNDS;

EID: 1242321504     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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