Static and dynamic experiments in cryo-electron microscopy: Comparative observations using high-vacuum, low-voltage and low-vacuum SEM

Journal of Microscopy

Volumn 213, Issue 2, 2004, Pages 198-204

  Stokes, D J ^a   Mugnier, J Y ^a   Clarke, C J ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNILEVER RESEARCH   (United Kingdom)

Author keywords

CryoESEM; CryoSEM; Ice cream; in situ sublimation; Low vacuum

Indexed keywords

MICROSTRUCTURAL EVOLUTION; SUBLIMATION;

CRYOESEM; CRYOSEM; DYNAMIC EXPERIMENT; HIGH VACUUM; ICE CREAMS; IN SITU SUBLIMATION; LOW VACUUM; LOW VOLTAGES; STATIC EXPERIMENTS; STATICS AND DYNAMICS;

SCANNING ELECTRON MICROSCOPY;

ICE;

ARTICLE; COMPARATIVE STUDY; CRYOELECTRON MICROSCOPY; DYNAMICS; ELECTRIC POTENTIAL; ELECTRON BEAM; FREEZING; ICE CREAM; INTERMETHOD COMPARISON; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STATISTICAL SIGNIFICANCE; THERMODYNAMICS; THERMOSTABILITY; ULTRASTRUCTURE; VACUUM;

EID: 1242314727     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2004.01282.x     Document Type: Article

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