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Volumn 5452, Issue , 2004, Pages 233-243

Astigmatism and beam quality of high-brightness tapered diode lasers

Author keywords

Astigmatism; Beam Quality; High Brightness Diode Laser; High Power Diode Laser; Tapered Laser

Indexed keywords

COMPUTER SIMULATION; FIBER OPTICS; GAIN CONTROL; MICROOPTICS; MOLECULAR BEAM EPITAXY; OPTICAL COMMUNICATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

EID: 12344334670     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.545221     Document Type: Conference Paper
Times cited : (26)

References (14)
  • 1
    • 0001379816 scopus 로고
    • Arrhenius parameters for the rate process leading to catastrophic damage of AlGaAs-GaAs laser facets
    • A. Moser, E.E. Latta, Arrhenius parameters for the rate process leading to catastrophic damage of AlGaAs-GaAs laser facets, J. Appl. Phys., vol. 71, pp. 4848-4853, 1992
    • (1992) J. Appl. Phys. , vol.71 , pp. 4848-4853
    • Moser, A.1    Latta, E.E.2
  • 6
    • 0001471602 scopus 로고    scopus 로고
    • Tapered high-power, high-brightness diode lasers: Design and performance, high-power diode lasers
    • M. Mikulla, Tapered High-Power, High-Brightness Diode Lasers: Design and Performance, High-Power Diode Lasers, Topics Appl. Phys., vol. 78, pp. 265-288, 2000
    • (2000) Topics Appl. Phys. , vol.78 , pp. 265-288
    • Mikulla, M.1
  • 8
    • 0005002221 scopus 로고    scopus 로고
    • Gain, refractive index change, and linewidth enhancement factor in broad-area GaAs and InGaAs quantum-well lasers
    • J. Stohs, D.J. Bossert, D.J. Gallant, and S.R.J. Brueck, Gain, Refractive Index Change, and Linewidth Enhancement Factor in Broad-Area GaAs and InGaAs Quantum-Well Lasers, IEEE J. Quant. Electr., vol. 37, No. 11, pp. 1449-1459, 2001
    • (2001) IEEE J. Quant. Electr. , vol.37 , Issue.11 , pp. 1449-1459
    • Stohs, J.1    Bossert, D.J.2    Gallant, D.J.3    Brueck, S.R.J.4
  • 9
    • 0035683529 scopus 로고    scopus 로고
    • Low confinement factors for suppressed filaments in semiconductor lasers
    • G.G. Dente, Low Confinement Factors for Suppressed Filaments in Semiconductor Lasers, IEEE J. Quant. Electron., vol. 37, no. 12, pp. 1650-1653, 2001
    • (2001) IEEE J. Quant. Electron. , vol.37 , Issue.12 , pp. 1650-1653
    • Dente, G.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.