Current oscillations in thin metal-oxide-semiconductor structures observed by ballistic electron emission microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 2296-2301

  Wen, H J ^a,c   Ludeke, R ^a   Schenk, Andreas ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b ETH ZURICH   (Switzerland)

^c IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11644284252     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590164     Document Type: Article

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