Microstructure, Raman and optical studies on Cd0.6Zn 0.4Te thin films

Materials Science and Engineering: B

Volumn 107, Issue 1, 2004, Pages 99-105

  Prabakar, K ^a   Venkatachalam, S ^a   Jeyachandran, Y L ^a   Narayandass, Sa K ^a   Mangalaraj, D ^b  

^a BHARATHIAR UNIVERSITY   (India)

^b Sungkyunkwan University   (South Korea)

Author keywords

Cd0.6Zn0.4Te thin films; Optical; Raman; Spectroscopic ellipsometry

Indexed keywords

DEPOSITION; ELLIPSOMETRY; EVAPORATION; FILM GROWTH; LIGHT ABSORPTION; LIGHT TRANSMISSION; MICROSTRUCTURE; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS; THIN FILMS; VACUUM; X RAY DIFFRACTION ANALYSIS;

CD0.6ZN0.4TE THIN FILMS; OPTICAL; RAMAN; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 1142288180     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.10.017     Document Type: Article

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