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Volumn 187, Issue 3-4, 1998, Pages 367-372

Characterization of CdTe substrates and MOCVD Cd1-xZnxTe epilayers by Raman, photoluminescence and X-ray diffraction techniques

(6) Levy, M a Amir, N a Khanin, E a Muranevich, A a Nemirovsky, Y a Beserman, R a

a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; DEFECTS; EPITAXIAL GROWTH; EXCITONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; RAMAN SCATTERING; X RAY ANALYSIS; ZINC COMPOUNDS;

TELLURIUM COMPOUNDS;

EID: 0032474180 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(98)00031-1 Document Type: Article

Times cited : (16)

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