Structural and optical parameters of ZnSxSe1-x films deposited on quartz substrates by laser ablation

Semiconductor Science and Technology

Volumn 13, Issue 12, 1998, Pages 1446-1455

  Ambrico, M ^a   Smaldone, D ^a   Spezzacatena, C ^a   Stagno, V ^b   Perna, G ^b   Capozzi, V ^b  

^a CNR   (Italy)

^b UNIVERSITY OF BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; ENERGY GAP; LASER ABLATION; LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT TRANSMISSION; QUARTZ; REFRACTIVE INDEX; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SUBSTRATES;

CAUCHY FORMULA; NEWTON-RAPHSON ALGORITHM;

SEMICONDUCTING FILMS;

EID: 0032303666     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/12/021     Document Type: Article

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