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Volumn 328, Issue 3-4, 2003, Pages 355-362

Structural, optical and Raman scattering studies on polycrystalline Cd0.8Zn0.2Te thin films prepared by vacuum evaporation

Author keywords

Cd0.8Zn0.2Te thin films; Optical; Raman scattering; Spectroscopic ellipsometry

Indexed keywords

CADMIUM COMPOUNDS; ELLIPSOMETRY; ENERGY GAP; FILM GROWTH; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

EID: 0037404009     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)01859-8     Document Type: Article
Times cited : (14)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.