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Volumn 328, Issue 3-4, 2003, Pages 355-362
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Structural, optical and Raman scattering studies on polycrystalline Cd0.8Zn0.2Te thin films prepared by vacuum evaporation
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Author keywords
Cd0.8Zn0.2Te thin films; Optical; Raman scattering; Spectroscopic ellipsometry
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Indexed keywords
CADMIUM COMPOUNDS;
ELLIPSOMETRY;
ENERGY GAP;
FILM GROWTH;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SOLAR CELLS;
X RAY DIFFRACTION ANALYSIS;
VACUUM EVAPORATION;
THIN FILMS;
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EID: 0037404009
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(02)01859-8 Document Type: Article |
Times cited : (14)
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References (32)
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