Noise performance of the radio-frequency single-electron transistor

Journal of Applied Physics

Volumn 95, Issue 3, 2004, Pages 1274-1286

  Roschier, Leif ^a   Hakonen, P ^a   Bladh, K ^b   Delsing, P ^b   Lehnert, K W ^c,d   Spietz, Lafe ^c   Schoelkopf, R J ^c  

^a AALTO UNIVERSITY   (Finland)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c YALE UNIVERSITY   (United States)

^d UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; IMPEDANCE MATCHING (ELECTRIC); RADIO FREQUENCY AMPLIFIERS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

AMPLIFIER NOISE; IMPEDANCE TRANSFORMER; RADIO FREQUENCY SINGLE ELECTRON TRANSISTOR;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 1142268127     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1635972     Document Type: Article

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