SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 218, Issue , 1997, Pages 196-204

Section 4. Pre- and post-treatment: Measurement of glass surface contamination

(1) Hattori, Akihiko a

a NIPPON SHEET GLASS CO LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; DEFECTS; FLUORINE COMPOUNDS; IMPURITIES; NITROGEN COMPOUNDS; RUBBER; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING FILMS; SEMICONDUCTING INDIUM COMPOUNDS; SILICONES; SODIUM;

INDIUM TIN OXIDE; PAPER STAINS; RUBBER SUCKER MARKS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF SIMS);

GLASS;

EID: 0031549388 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/s0022-3093(97)00201-9 Document Type: Article

Times cited : (19)

References (14)

1
- 0003746874
- Chapman and Hall, New York
- L. Holland, The Properties of Glass Surface (Chapman and Hall, New York, 1964) p. 357.
- (1964) The Properties of Glass Surface , pp. 357
- Holland, L.¹

2
- 0040804810
- Okayama
- M. Nagai, T. Goda, A. Hattori, Proc. Second Young Ceramist Meeting, Okayama, 1995, p. 48.
- (1995) Proc. Second Young Ceramist Meeting , pp. 48
- Nagai, M.¹ Goda, T.² Hattori, A.³

3
- 0039618647
- Osaka
- A. Hattori, Proc. 48th New Glass Workshop, Osaka, 1997, p. 1.
- (1997) Proc. 48th New Glass Workshop , pp. 1
- Hattori, A.¹

4
- 53249086462
- P. Steffens, E. Niehuis, T. Friese, D. Greifendorf, A. Benninghoven, J. Vac. Sci. Technol. A3 (1985) 1322.
- (1985) J. Vac. Sci. Technol. , vol.A3 , pp. 1322
- Steffens, P.¹ Niehuis, E.² Friese, T.³ Greifendorf, D.⁴ Benninghoven, A.⁵

5
- 5244367369
- E. Niehuis, T. Heller, H. Feld, A. Benninghoven, J. Vac. Sci. Technol. A5 (1987) 1243.
- (1987) J. Vac. Sci. Technol. , vol.A5 , pp. 1243
- Niehuis, E.¹ Heller, T.² Feld, H.³ Benninghoven, A.⁴

6
- 0024621989
- E. Niehuis, P.N.T. van Velzen, J. Lub, T. Heller, A. Benninghoven, Surf. Interf. Anal. 14 (1989) 135.
- (1989) Surf. Interf. Anal. , vol.14 , pp. 135
- Niehuis, E.¹ Van Velzen, P.N.T.² Lub, J.³ Heller, T.⁴ Benninghoven, A.⁵

7
- 0040210393
- E. Niehuis, T. Heller, U. Jürgens, A. Benninghoven, J. Vac. Sci. Technol. A7 (1989) 1832.
- (1989) J. Vac. Sci. Technol. , vol.A7 , pp. 1832
- Niehuis, E.¹ Heller, T.² Jürgens, U.³ Benninghoven, A.⁴

8
- 84957224374
- B. Hagenhoff, D. van Leyer, E. Niehuis, A. Benninghoven, J. Vac. Sci. Technol. A7 (1989) 3056.
- (1989) J. Vac. Sci. Technol. , vol.A7 , pp. 3056
- Hagenhoff, B.¹ Van Leyer, D.² Niehuis, E.³ Benninghoven, A.⁴

9
- 0040210392
- J. Schwieters, H.G. Cramer, T. Heller, U. Jürgens, E. Niehuis, J. Zehnpfenning, A. Benninghoven, J. Vac. Sci. Technol. A7 (1989) 3056.
- (1989) J. Vac. Sci. Technol. , vol.A7 , pp. 3056
- Schwieters, J.¹ Cramer, H.G.² Heller, T.³ Jürgens, U.⁴ Niehuis, E.⁵ Zehnpfenning, J.⁶ Benninghoven, A.⁷

10
- 0025566468
- Schueler, P. Sander, D.A. Reed, Vacuum 41 (1990) 1661.
- (1990) Vacuum , vol.41 , pp. 1661
- Schueler¹ Sander, P.² Reed, D.A.³

11
- 0003958699
- ed. M.D. Morris Marcel Dekker, New York, eh. 10
- Odom, in: Microscopic and Spectroscopic Imaging of the Chemical State, ed. M.D. Morris (Marcel Dekker, New York, 1993) eh. 10.
- (1993) Microscopic and Spectroscopic Imaging of the Chemical State
- Odom¹

12
- 0024063916
- H. Nagayama, H. Honda, H. Kawahara, J. Electrochem. Soc. 135 (1988) 2013.
- (1988) J. Electrochem. Soc. , vol.135 , pp. 2013
- Nagayama, H.¹ Honda, H.² Kawahara, H.³

13
- 0002261152
- X. Schueler, Microsc. Microanal. Microstruct, 3 (1992) 1.
- (1992) Microsc. Microanal. Microstruct , vol.3 , pp. 1
- Schueler, X.¹

14
- 0028742665
- J.J. Lee, P.M. Lindley, R.W. Odom, Mater. Res. Soc. Symp. Proc. 345 (1994) 197.
- (1994) Mater. Res. Soc. Symp. Proc. , vol.345 , pp. 197
- Lee, J.J.¹ Lindley, P.M.² Odom, R.W.³

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