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Volumn 381, Issue 1, 1997, Pages 18-32

ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence for fragmentation and metastable decay processes in molecular secondary ion emission

Author keywords

Ion emission; Metastable decay; Polystyrene; Secondary ion mass spectroscopy; Silicon; Silver; Sputtering

Indexed keywords

DECOMPOSITION; DISSOCIATION; ION BOMBARDMENT; POLYSTYRENES; PROTONS; SECONDARY ION MASS SPECTROMETRY; SILICON; SILVER; SPUTTERING;

EID: 0031169509     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00070-8     Document Type: Article
Times cited : (31)

References (44)
  • 35
    • 85033115172 scopus 로고    scopus 로고
    • private communication
    • B.W. Schueler, private communication.
    • Schueler, B.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.