Study of molecular surface diffusion by imaging static Secondary Ion Mass Spectrometry (SIMS): Polymers on Ag-surfaces

Applied Surface Science

Volumn 134, Issue 1-4, 1998, Pages 271-274

  Deimel, M ^a   Rulle, H ^a   Liebing, V ^a   Benninghoven, A ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Polymers; SIMS; Surface diffusion; Surface mass spectrometry

Indexed keywords

ETCHING; FLUORINE CONTAINING POLYMERS; POLYETHERS; POLYMETHYL METHACRYLATES; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SILICONES; SILVER; SUBSTRATES; SURFACE PHENOMENA;

POLYDIMETHYLSILOXANE;

DIFFUSION IN SOLIDS;

EID: 0032165772     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00248-7     Document Type: Article

References (7)

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