Characterization of Polystyrene (1 kDa) with a Perfluorinated Endgroup by TOF-SIMS: Effects of Sample Preparation

Surface Science Spectra

Volumn 4, Issue 4, 1996, Pages 363-369

  Belu, A M ^a   Hunt, M O ^a   Linton, R W ^a  

^a University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM PREPARATION; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY;

END GROUPS; FUNCTIONALIZED; LOW-MASS; LOW-MOLECULAR-WEIGHT POLYMERS; MEASUREMENTS OF; OVERLAYERS; SAMPLE PREPARATION;

THICK FILMS;

EID: 11244262692     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/1.1247826     Document Type: Article

References (5)

1. M. O.Hunt, Jr., A. M.Belu, R. W.Linton, and J. M.DeSimone, Macromolecules 26, 4854 (1993). 10.1021/ma00070a020
2. A. M.Belu, M. O.Hunt, Jr., J. M.DeSimone, and R. W.Linton, Surf. Sci. Spectra 4, 109 (1997).
3. R. W.Linton, M. P.Mawn, A. M.Belu, J. M.DeSimone, M. O.Hunt, Jr., Y. Z.Mendeloglu, H. G.Cramer, and A.Benninghoven, Surf. Interface Anal. 20, 991 (1993). 10.1002/sia.740201210
4. E.Niehuis, T.Heller, H.Feld, and A.Benninghoven, J. Vac. Sci. Technol. A 5, 1243 (1987). 10.1116/1.574781
5. G. J.Leggett and J. C.Vickerman, Int. J. Mass Spectrom. Ion Processes 122, 281 (1992). 10.1016/0168-1176(92)87021-6