Intergranular film thickness of self-reinforced silicon carbide ceramics

Journal of the European Ceramic Society

Volumn 24, Issue 15-16, 2004, Pages 3795-3800

  Choi, Heon Jin ^a   Kim, Young Wook ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b University of Seoul   (South Korea)

Author keywords

Electron microscopy; Grain boundaries; Interphase; Liquid phase sintering; SiC

Indexed keywords

CERAMIC MATERIALS; FILMS; HIGH RESOLUTION ELECTRON MICROSCOPY; SINTERING;

FILM THICKNESS; GLASSY FILMS;

SILICON CARBIDE;

CERAMICS;

EID: 11144259544     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2003.12.029     Document Type: Article

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