High-resolution synchrotron-radiation photoemission characterization for atomically-controlled SrTiO3(001) substrate surfaces subjected to various surface treatments

Journal of Applied Physics

Volumn 96, Issue 12, 2004, Pages 7183-7188

  Kobayashi, D ^a   Kumigashira, H ^a   Oshima, M ^a   Ohnishi, T ^a   Lippmaa, M ^a,e   Ono, K ^b   Kawasaki, M ^c,e   Koinuma, H ^d,e  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e Combinatorial Mat Explor/Technol ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; ELECTRONIC STRUCTURE; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; STRONTIUM COMPOUNDS; SURFACE TREATMENT; THIN FILMS;

COAXIAL IMPACT-COLLISION ION SCATTERING SPECTROSCOPUY (CAICISS); FRICTION FORCE MICROSCOPY (FFM); SYNCHROTRON RADIATION PHOTOEMISSION SPECTROSCOPY (SRPES);

SYNCHROTRON RADIATION;

EID: 11044228712     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1814175     Document Type: Article

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