SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 474, Issue 1-2, 2005, Pages 169-172

Femtosecond laser-induced crystallization in amorphous Ge 2Sb2Te5 films

(5) Zhang, Guangjun a Gu, Donghong a Gan, Fuxi a Jiang, Xiongwei a Chen, Qingxi a

a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS (China)

Author keywords

Amorphous materials; Annealing; Crystallization; Femtosecond laser

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTALLIZATION; LASER BEAM EFFECTS; LIGHT REFLECTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GERMANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE STATES; FEMTOSECOND LASERS; LASER-INDUCED CRYSTALLIZATION; X-RAY DIFFRACTION MEASUREMENTS;

AMORPHOUS FILMS;

EID: 10844238103 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2004.08.122 Document Type: Article

Times cited : (30)

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