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Volumn 151, Issue 5, 2004, Pages 433-436

(Ga,In)(N,As)-based solar cells grown by molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; PHOTONS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SHORT CIRCUIT CURRENTS; SPECTRUM ANALYSIS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 10644260482     PISSN: 13502433     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-opt:20040890     Document Type: Article
Times cited : (9)

References (13)
  • 7
    • 0036681737 scopus 로고    scopus 로고
    • 'Breakeven criteria for the GaInNAs junction in GaInP/GaAs/GaInNAs/Ge four-junction solar cells'
    • Friedman, D.J., and Kurtz, S.R.: 'Breakeven criteria for the GaInNAs junction in GaInP/GaAs/GaInNAs/Ge four-junction solar cells', Prog. Photovolt., Res. Appl., 2002, 10, pp. 331-344
    • (2002) Prog. Photovolt., Res. Appl. , vol.10 , pp. 331-344
    • Friedman, D.J.1    Kurtz, S.R.2
  • 8
    • 0000310795 scopus 로고    scopus 로고
    • 'Minority carrier diffusion, defects, and localization in InGaAsN, with 2% of nitrogen'
    • Kurtz, S.R., Allerman, A.A., Seager, C.H., Sieg, R.M., and Jones, E.D.: 'Minority carrier diffusion, defects, and localization in InGaAsN, with 2% of nitrogen', Appl. Phys. Lett., 2000, 77, pp. 400-402
    • (2000) Appl. Phys. Lett. , vol.77 , pp. 400-402
    • Kurtz, S.R.1    Allerman, A.A.2    Seager, C.H.3    Sieg, R.M.4    Jones, E.D.5
  • 9
    • 79957945838 scopus 로고    scopus 로고
    • 'Minority carrier diffusion and defects in InGaAsN grown by molecular beam epitaxy'
    • Kurtz, S.R., Klem, J.F., Allerman, A.A., Sieg, R.M., Seager, C.H., and Jones, E.D.: 'Minority carrier diffusion and defects in InGaAsN grown by molecular beam epitaxy', Appl. Phys. Lett., 2002, 80, pp. 1379-1381
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 1379-1381
    • Kurtz, S.R.1    Klem, J.F.2    Allerman, A.A.3    Sieg, R.M.4    Seager, C.H.5    Jones, E.D.6
  • 10
    • 0035911437 scopus 로고    scopus 로고
    • 'Characterization of defects in doped InGaAsN grown by molecular-beam epitaxy'
    • Fleck, A., Robinson, B.J., and Thompson, D.A.: 'Characterization of defects in doped InGaAsN grown by molecular-beam epitaxy', Appl. Phys. Lett., 2001, 78, pp. 1694-1696
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 1694-1696
    • Fleck, A.1    Robinson, B.J.2    Thompson, D.A.3
  • 12
    • 0000136864 scopus 로고
    • 'Solar cells'
    • Academic Press, New York, USA
    • Hovel, H.J.: 'Solar cells', Semiconductors and semimetals, vol. 11 (Academic Press, New York, USA, 1975)
    • (1975) Semiconductors and Semimetals , vol.11
    • Hovel, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.