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Volumn 251, Issue 1-4, 2003, Pages 392-398
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A comparison of MBE- and MOCVD-grown GaInNAs
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Author keywords
A1. Impurities; A1. Point defects; A3. Metalorganic chemical vapor deposition; A3. Molecular beam epitaxy; B1. Nitrides
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Indexed keywords
CRYSTAL IMPURITIES;
MAGNETIC RESONANCE;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
POINT DEFECTS;
SECONDARY ION MASS SPECTROMETRY;
SOLAR CELLS;
X RAY DIFFRACTION ANALYSIS;
MATERIAL QUALITY;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0037381458
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)02201-7 Document Type: Conference Paper |
Times cited : (98)
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References (16)
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