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Volumn 51, Issue 12, 2004, Pages 2249-2251

Impact of high-k plug on self-heating effects of SOI MOSFETs

Author keywords

Buried insulator; Heat flow; MOSFET; SOI; Thermal conductivity

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SILICA; SILICON ON INSULATOR TECHNOLOGY; THERMAL CONDUCTIVITY; THERMAL EFFECTS; THERMAL INSULATING MATERIALS;

EID: 10644239188     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.839874     Document Type: Article
Times cited : (4)

References (7)
  • 2
    • 0842309721 scopus 로고    scopus 로고
    • "Thermal analysis of ultra-thin body device scaling"
    • Washington, DC, Dec
    • E. Pop, R. Dutton, and K. Goodson, "Thermal analysis of ultra-thin body device scaling," in IEEE IEDM Tech. Dig., Washington, DC, Dec. 2003, pp. 883-886.
    • (2003) IEEE IEDM Tech. Dig. , pp. 883-886
    • Pop, E.1    Dutton, R.2    Goodson, K.3
  • 3
    • 0036540437 scopus 로고    scopus 로고
    • "Excellent cross-talk isolation, high-Q inductors, and reduced self-heating in a TFSOI technology for system-on-a-chip applications"
    • Apr
    • M. Kumar, Y. Tan, and J. K. O. Sin, "Excellent cross-talk isolation, high-Q inductors, and reduced self-heating in a TFSOI technology for system-on-a-chip applications," IEEE Trans. Electron Devices, vol. 49, pp. 584-589, Apr. 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , pp. 584-589
    • Kumar, M.1    Tan, Y.2    Sin, J.K.O.3
  • 4
    • 0036890543 scopus 로고    scopus 로고
    • "Study of novel techniques for reducing self-heating effects in SOI power LDMOS"
    • J. Roig, D. Flores, S. Hidalgo, M. Vellvehi, J. Rebollo, and J. Millan, "Study of novel techniques for reducing self-heating effects in SOI power LDMOS," Solid-State Electron, vol. 46, pp. 2123-2133, 2002.
    • (2002) Solid-State Electron , vol.46 , pp. 2123-2133
    • Roig, J.1    Flores, D.2    Hidalgo, S.3    Vellvehi, M.4    Rebollo, J.5    Millan, J.6
  • 5
    • 0036723289 scopus 로고    scopus 로고
    • "Fabrication of silicon-on-AlN novel structure and its residual strain characterization"
    • Z. An, C. Men, X. Xie, M. Zhang, P. K. Chu, and C. Lin, " Fabrication of silicon-on-AlN novel structure and its residual strain characterization," J. Cryst. Growth, vol. 244, pp. 27-32, 2002.
    • (2002) J. Cryst. Growth , vol.244 , pp. 27-32
    • An, Z.1    Men, C.2    Xie, X.3    Zhang, M.4    Chu, P.K.5    Lin, C.6
  • 6
    • 1442360790 scopus 로고    scopus 로고
    • "Advanced SOI MOSFET's with buried alumina and ground plane: Self-heating and short channel effects"
    • K. Oshima, S. Cristoloveanu, B. Guillaumot, H. Iwai, and S. Deleonibus, "Advanced SOI MOSFET's with buried alumina and ground plane: Self-heating and short channel effects," Solid-State Electron, vol. 48, pp. 907-917, 2004.
    • (2004) Solid-State Electron , vol.48 , pp. 907-917
    • Oshima, K.1    Cristoloveanu, S.2    Guillaumot, B.3    Iwai, H.4    Deleonibus, S.5
  • 7
    • 85020156117 scopus 로고    scopus 로고
    • Operation Manual Ver. 7
    • Operation Manual Ver. 7.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.