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Volumn 1, Issue , 2004, Pages 427-436

Thermo-mechanical reliability of power flip-chip cooling concepts

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; ELECTRONICS INDUSTRY; HEAT SINKS; RELIABILITY; THERMAL LOAD; THERMOMECHANICAL TREATMENT;

EID: 10444231944     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (16)

References (37)
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    • Reichl, H.1    Michel, B.2    Schubert, A.3
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    • Surface-mount attachment reliability of chip-leaded cheramic chip carriers on FR-4 circuit boards
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    • Engelmaier, W.1    Attarwala, A.2
  • 13
    • 0013190329 scopus 로고    scopus 로고
    • Package reliability studies by experimental and numerical analysis
    • April 17-19, Berlin, Germany
    • A. Schubert, R. Dudek, B. Michel, and H. Reichl. Package Reliability Studies by Experimental and Numerical Analysis. Proc. 3. Int. Conf. on Micromaterials, pages 110-119, April 17-19, Berlin, Germany 2000.
    • (2000) Proc. 3. Int. Conf. on Micromaterials , pp. 110-119
    • Schubert, A.1    Dudek, R.2    Michel, B.3    Reichl, H.4
  • 16
    • 0032291670 scopus 로고    scopus 로고
    • The effect of underfill and underfill delamination on the thermal stress in flip-chip solder joints
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    • (1998) Journal of Electronic Packaging
    • Rzepka, S.1    Korhonen, M.A.2    Meusel, E.3    Li, C.Y.4
  • 17
    • 0008922476 scopus 로고    scopus 로고
    • Influence of die size on the magnitude of thermomechanical stresses in flip-chips directly attached to printed wiring board
    • ASME EEP
    • C.A. Le Gall et. al. Influence of Die Size on the Magnitude of Thermomechanical Stresses in Flip-Chips Directly Attached to Printed Wiring Board. ASME EEP-Vol. 19-2, Advances in Electronic Packaging - Proc. Interpack 1997, pages 1663-1670, 1997.
    • (1997) Advances in Electronic Packaging - Proc. Interpack 1997 , vol.19 , Issue.2 , pp. 1663-1670
    • Le Gall, C.A.1
  • 18
    • 2442438406 scopus 로고    scopus 로고
    • Thermo-mechanical reliability of microcomponents
    • April 17-19, Berlin, Germany
    • R. Dudek, A. Schubert, and B. Michel. Thermo-Mechanical Reliability of Microcomponents. Proc. 3. Int. Conf. on Micromaterials, pages 206-213, April 17-19, Berlin, Germany 2000.
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    • Thermal Stress and Strain in Microelectronic Packaging , pp. 466-499
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    • (2003) Thermo-mechanical Reliability of Flip-chips with Heat-spreaders
    • Wunderle, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.