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Volumn , Issue , 2000, Pages 77-85
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Analyses of flip chip attach reliability
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Author keywords
Application software; Assembly; Fatigue; Finite element methods; Flip chip; Optimization; Parametric study; Polymers; Temperature; Thermomechanical processes
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Indexed keywords
APPLICATION PROGRAMS;
ASSEMBLY;
CHARACTERIZATION;
CHIP SCALE PACKAGES;
COATINGS;
ELECTRONICS PACKAGING;
FATIGUE OF MATERIALS;
FLIP CHIP DEVICES;
JOINING;
MANUFACTURE;
OPTIMIZATION;
PLASTIC COATINGS;
POLYMERS;
TEMPERATURE;
TENSILE TESTING;
VISCOELASTICITY;
ENVIRONMENTAL CONDITIONS;
FLIP CHIP;
PACKAGING TECHNOLOGIES;
PARAMETRIC STUDY;
PERFORMANCE OPTIMIZATIONS;
THERMO-MECHANICAL BEHAVIORS;
THERMO-MECHANICAL DESIGN;
THERMOMECHANICAL PROCESS;
FINITE ELEMENT METHOD;
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EID: 84952326162
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ADHES.2000.860577 Document Type: Conference Paper |
Times cited : (19)
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References (8)
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