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Volumn 109, Issue 1-2, 2003, Pages 88-94

Effect of gas pressure on the sensitivity of a micromachined thermal accelerometer

Author keywords

Accelerometer; Thermal sensor

Indexed keywords

APPROXIMATION THEORY; BOUNDARY LAYERS; CMOS INTEGRATED CIRCUITS; DEFORMATION; ELECTRIC RESISTANCE; HEAT TRANSFER; MATHEMATICAL MODELS; MICROMACHINING; MICROSTRUCTURE; PRANDTL NUMBER; PRESSURE EFFECTS; THERMAL EFFECTS; VECTORS;

EID: 0942289925     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2003.09.025     Document Type: Article
Times cited : (40)

References (17)
  • 3
    • 0032051393 scopus 로고    scopus 로고
    • Temperature dependence and drift of a thermal accelerometer
    • Dauderstädt U.A., Sarro P.M., French P.J. Temperature dependence and drift of a thermal accelerometer. Sens. Actuators A. 66:1998;244-249.
    • (1998) Sens. Actuators A , vol.66 , pp. 244-249
    • Dauderstädt, U.A.1    Sarro, P.M.2    French, P.J.3
  • 7
    • 0031654994 scopus 로고    scopus 로고
    • Micromachined accelerometer based on convection heat transfer
    • Leung A.M., Jones J., Czyzewska E., Chen J., Woods B. Micromachined accelerometer based on convection heat transfer. MEMS. 98:1998;627-630.
    • (1998) MEMS , vol.98 , pp. 627-630
    • Leung, A.M.1    Jones, J.2    Czyzewska, E.3    Chen, J.4    Woods, B.5
  • 10
    • 0035443304 scopus 로고    scopus 로고
    • An optimized micromachined convective accelerometer with no proof mass
    • Luo X.B., Yang Y.J., Zheng F., Li Z.X., Guo Z.Y. An optimized micromachined convective accelerometer with no proof mass. J. Michromech. Microeng. 11:2001;504-508.
    • (2001) J. Michromech. Microeng. , vol.11 , pp. 504-508
    • Luo, X.B.1    Yang, Y.J.2    Zheng, F.3    Li, Z.X.4    Guo, Z.Y.5
  • 11
    • 0036891820 scopus 로고    scopus 로고
    • Study on linearity of a micromachined convective accelerometer
    • Luo X.B., Li Z.X., Guo Z.Y., Yang Y.J. Study on linearity of a micromachined convective accelerometer. Microelectron. Eng. 65:2003;87-101.
    • (2003) Microelectron. Eng. , vol.65 , pp. 87-101
    • Luo, X.B.1    Li, Z.X.2    Guo, Z.Y.3    Yang, Y.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.