Recent Progress in FET-type Ferroelectric Memories

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2003, Pages 263-266

  Ishiwara, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DIELECTRIC FILMS; ELECTRIC CHARGE; ELECTRIC FIELDS; ELECTRIC POTENTIAL; FERROELECTRIC MATERIALS; GATES (TRANSISTOR); LEAKAGE CURRENTS; MOSFET DEVICES; PERMITTIVITY; POLARIZATION; REMANENCE; SHORT CIRCUIT CURRENTS;

DATA RETENTION; DRAIN CURRENTS;

RANDOM ACCESS STORAGE;

EID: 0842288267     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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