Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 3, 2004, Pages 387-392

  Angelescu, D E ^a   Harrison, C K ^b   Trawick, M L ^a   Chaikin, P M ^a   Register, R A ^a,c   Adamson, D H ^a  

^a PRINCETON UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COPOLYMERS; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

ORIENTATION IMAGING MICROSCOPY; TAPPING MODE ATOMIC FORCE MICROSCOPY; TWO DIMENSIONAL CRYSTALS;

IMAGE ANALYSIS;

EID: 0742286255     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-2012-5     Document Type: Article

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