![]() |
Volumn 78, Issue 3, 2004, Pages 387-392
|
Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
COPOLYMERS;
GRAIN BOUNDARIES;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
ORIENTATION IMAGING MICROSCOPY;
TAPPING MODE ATOMIC FORCE MICROSCOPY;
TWO DIMENSIONAL CRYSTALS;
IMAGE ANALYSIS;
|
EID: 0742286255
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-002-2012-5 Document Type: Article |
Times cited : (12)
|
References (17)
|