Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2000, Pages 222-223

  Polonsky, S ^a   Knebel, D ^a   Sanda, P ^a   McManus, M ^a   Huott, W ^a   Pelella, A ^a   Manzer, D ^a   Steen, S ^a   Wilson, S ^a   Chan, Y ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CACHE MEMORY; ELECTROLUMINESCENCE; FLIP CHIP DEVICES; MOSFET DEVICES; PHOTONS; STATIC RANDOM ACCESS STORAGE; SWITCHING THEORY;

PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA);

MICROPROCESSOR CHIPS;

EID: 0034429731     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Dynamic internal testing of CMOS circuits using hot luminescence
2. Picosecond imaging circuit analysis of the POWER3 clock distribution
3. Diagnosis and characterization of timing-related defects by time-dependent light emission
4. The attack of the 'holey schmoos' a case study of advanced DFD and picosecond imaging circuit analysis (PICA)
5. Picosecond imaging circuit analysis of the IBM G6 microprocessor cache
6. Picosecond imaging circuit analysis