메뉴 건너뛰기




Volumn 34, Issue 21, 1998, Pages 2024-2025

Experimental verification of the link between timing jitter and phase noise

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; OSCILLATORS (ELECTRONIC); PHASE MODULATION; SPURIOUS SIGNAL NOISE;

EID: 0032181071     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19981419     Document Type: Article
Times cited : (10)

References (3)
  • 1
    • 0003679603 scopus 로고
    • Short-term frequency stability: Characterization, theory, and measurement
    • BAGHDADY, E., LINCOLN, R., and NELIN, B.: 'Short-term frequency stability: characterization, theory, and measurement', Proc. IEEE, 1965, 53, (7), pp. 704-722
    • (1965) Proc. IEEE , vol.53 , Issue.7 , pp. 704-722
    • Baghdady, E.1    Lincoln, R.2    Nelin, B.3
  • 3
    • 0016128384 scopus 로고
    • The logic design of time-to-pulse-height converters
    • BERTOLACCINI, M., and COVA, s.: 'The logic design of time-to-pulse-height converters', Nucl. Instrum. Methods, 1974, 121, pp. 547-566
    • (1974) Nucl. Instrum. Methods , vol.121 , pp. 547-566
    • Bertolaccini, M.1    Cova, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.